Hardware
/
litedram
mirror of https://github.com/enjoy-digital/litedram.git
1
0
Fork 0
Code Issues Packages Projects Releases Wiki Activity

test/test_bist: use generator to corrupt memory (allow testing base address on checker/generator)

This commit is contained in:
Florent Kermarrec 2017-01-17 14:35:34 +01:00
parent 40168db0b4
commit d213a628f8
1 changed files with 4 additions and 8 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

12
test/test_bist.py
View File

@ -56,22 +56,18 @@ def main_generator(dut, mem):
yield from checker.run(16, 64)
assert checker.errors == 0
# corrupt memory (4 errors)
for i in range(4):
mem.mem[i+16] = ~mem.mem[i+16]
# corrupt memory (using generator)
yield from generator.reset()
yield from generator.run(16 + 60, 64)
# read (4 errors)
yield from checker.reset()
yield from checker.run(16, 64)
assert checker.errors == 4
# revert memory
for i in range(4):
mem.mem[i+16] = ~mem.mem[i+16]
# read (no errors)
yield from checker.reset()
yield from checker.run(16, 64)
yield from checker.run(16 + 60, 64)
assert checker.errors == 0