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Minor changes and build fixes for new riscv-gnu-toolchain

This commit is contained in:
Clifford Wolf 2016-12-10 12:09:15 +01:00
parent f29376ac22
commit 9d873cac92
3 changed files with 1 additions and 13 deletions
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2
Makefile
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@ -69,7 +69,7 @@ firmware/firmware.elf: $(FIRMWARE_OBJS) $(TEST_OBJS) firmware/sections.lds
chmod -x $@ chmod -x $@
firmware/start.o: firmware/start.S firmware/start.o: firmware/start.S
$(TOOLCHAIN_PREFIX)gcc -c -m32 -march=RV32IM$(COMPRESSED_ISA)Xcustom -o $@ $< $(TOOLCHAIN_PREFIX)gcc -c -m32 -march=RV32IM$(COMPRESSED_ISA) -o $@ $<
firmware/%.o: firmware/%.c firmware/%.o: firmware/%.c
$(TOOLCHAIN_PREFIX)gcc -c -m32 -march=RV32I$(COMPRESSED_ISA) -Os --std=c99 $(GCC_WARNS) -ffreestanding -nostdlib -o $@ $< $(TOOLCHAIN_PREFIX)gcc -c -m32 -march=RV32I$(COMPRESSED_ISA) -Os --std=c99 $(GCC_WARNS) -ffreestanding -nostdlib -o $@ $<

6
tests/sb.S
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@ -19,13 +19,7 @@ RVTEST_CODE_BEGIN
TEST_ST_OP( 2, lb, sb, 0xffffffaa, 0, tdat ); TEST_ST_OP( 2, lb, sb, 0xffffffaa, 0, tdat );
TEST_ST_OP( 3, lb, sb, 0x00000000, 1, tdat ); TEST_ST_OP( 3, lb, sb, 0x00000000, 1, tdat );
#ifdef __RISCVEL
TEST_ST_OP( 4, lh, sb, 0xffffefa0, 2, tdat ); TEST_ST_OP( 4, lh, sb, 0xffffefa0, 2, tdat );
#elif defined(__RISCVEB)
#else
TEST_ST_OP( 4, lh, sb, 0xffffa0ef, 2, tdat );
#error unknown endianness!
#endif
TEST_ST_OP( 5, lb, sb, 0x0000000a, 3, tdat ); TEST_ST_OP( 5, lb, sb, 0x0000000a, 3, tdat );
# Test with negative offset # Test with negative offset

6
tests/sh.S
View File

@ -19,13 +19,7 @@ RVTEST_CODE_BEGIN
TEST_ST_OP( 2, lh, sh, 0x000000aa, 0, tdat ); TEST_ST_OP( 2, lh, sh, 0x000000aa, 0, tdat );
TEST_ST_OP( 3, lh, sh, 0xffffaa00, 2, tdat ); TEST_ST_OP( 3, lh, sh, 0xffffaa00, 2, tdat );
#ifdef __RISCVEL
TEST_ST_OP( 4, lw, sh, 0xbeef0aa0, 4, tdat ); TEST_ST_OP( 4, lw, sh, 0xbeef0aa0, 4, tdat );
#elif defined(__RISCVEB)
#else
TEST_ST_OP( 4, lw, sh, 0x0aa0beef, 4, tdat );
#error unknown endianness!
#endif
TEST_ST_OP( 5, lh, sh, 0xffffa00a, 6, tdat ); TEST_ST_OP( 5, lh, sh, 0xffffa00a, 6, tdat );
# Test with negative offset # Test with negative offset